One-stop support covering materials, ROICs, SWIR sensors, prototype development, process integration, characterization, and technical services.
Global academic & research partners
University faculty & scientific researchers served
Imaging tests completed
Imaging chips processed & fabricated
InRight Tech's Monolithic Integration and Imaging Characterization Platform has supported numerous research projects resulting in publications in leading scientific journals.
First published: 16/06/2022
Authors: Jing Liu, Peilin Liu, Dengyang Chen, Tailong Shi, Xixi Qu, Long Chen, Tong Wu, Jiangping Ke, Kao Xiong, Mingyu Li, Haisheng Song, Wei Wei, Junkai Cao, Jianbing Zhang, Liang Gao & Jiang Tang
DOI: 10.1038/s41928-022-00779-x
First published: 02/09/2023
Authors: Jing Liu, Peilin Liu, Tailong Shi, Mo Ke, Kao Xiong, Yuxuan Liu, Long Chen, Linxiang Zhang, Xinyi Liang, Hao Li, Shuaicheng Lu, Xinzheng Lan, Guangda Niu, Jianbing Zhang, Peng Fei, Liang Gao & Jiang Tang
DOI: 10.1038/s41467-023-40620-3
First published: 23/07/2024
Authors: Binbin Wang, Mohan Yuan, Jing Liu, Xingchen Zhang, Jing Liu, Ji Yang, Liang Gao, Jianbing Zhang, Jiang Tang, and Xinzheng Lan
DOI: 10.1021/acs.nanolett.4c02235
First published: 24/02/2025
Authors: Long Chen, Shijie Liu, Zunyu Liu, Weidong Wu, Hao Li, Yuxuan Liu, Xing Zhou, Jing Liu, Xinzheng Lan, Luying Li, Jianbing Zhang, Liang Gao, Jiang Tang
DOI: 10.1002/adfm.202501770
First published:
Authors: Huicheng Hu, Jing Liu, Jing Liu, Mohan Yuan, Haifei Ma, Binbin Wang, Ya Wang, Hang Xia, Junrui Yang, Liang Gao, Jianbing Zhang, Jiang Tang, and Xinzheng Lan
DOI: 10.1021/acsnano.4c17257
First published: 29/08/2025
Authors: Hang Xia, Jing Liu, Mohan Yuan, Xudong Hu, Liang Gao, Jianbing Zhang, Jiang Tang, and Xinzheng Lan
DOI: 10.1021/acs.nanolett.5c03752
First published: 20/01/2026
Authors: Ciyu Ge, Chengjie Deng, Jiaxing Zhu, Yongcheng Zhu, Qi Xu, Borui Jiang, Long Chen, Yuxuan Liu, Boxiang Song, Ping Fu, Chao Chen, Liang Gao & Jiang Tang
DOI: 10.1038/s41377-025-02127-y
First published: 17/02/2026
Authors: Yupu Wang, Ruochen Wang, Feng Li, Huimiao Li, Wenkai Zhao, Yunfeng Deng, Guanghui Li, Guankui Long, Yongsheng Chen, Miaomiao Li, Yanhou Geng
DOI: 10.1002/anie.202525467
First published: 20/03/2026
Authors: Ling Lin, Xinyue Wang, Liang Li, ..., Shenglin Jiang, Guangzu Zhang, Kanghua Li
DOI: 10.1016/j.matlit.2026.100002
First published: 21/03/2026
Authors: i Ji, ianhao Zhao, Yuxuan Liu, …, John G. Labram, Can Li , Tianshuo Zhao
DOI: 10.1016/j.device.2026.101111
End-to-end micro/nano fabrication, die bonding, packaging, and reliability testing for monolithic and heterogeneous integrated imaging devices.
Advanced SWIR imaging and optoelectronic characterization platforms for spatial, spectral, temporal, and quantum-efficiency testing of imaging chips and FPAs.
We welcome opportunities to collaborate with customers, researchers, and industry partners worldwide.
3F, Optics Valley Overseas Talent Innovation Park, Jiayuan Road, Hongshan District, Wuhan, China
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Media Collaboration: mjwu@inrighttech.com
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